Please use this identifier to cite or link to this item:
https://dspace.iiti.ac.in/handle/123456789/17208
| Title: | Thin-film dielectric material for application in nanoelectronics: structural analysis for x-ray scattering [RESTRICTED THESIS-05 Years] |
| Authors: | Kuri, Abhishek |
| Supervisors: | Chattopadhyay, Sudeshna |
| Keywords: | Physics |
| Issue Date: | 21-May-2025 |
| Publisher: | Department of Physics, IIT Indore |
| Series/Report no.: | MS576; |
| Abstract: | [Abstract is restricted for 05 Years, due to IPR related issue] |
| URI: | https://dspace.iiti.ac.in:8080/jspui/handle/123456789/17208 |
| Type of Material: | Thesis_M.Sc |
| Appears in Collections: | Department of Physics_ETD |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Restricted Thesis.pdf Restricted Access | 44.68 kB | Adobe PDF | View/Open Request a copy |
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