Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/19401
Title: MemScope: Real-Time, Portable, Power- and Cost-Efficient Memristor Characterization System
Authors: Kumar, Mohit (60389121600)
Kumar Hindoliya, Lokesh (60883804400)
Paul, Animesh (59315239900)
Yadav, Saurabh (58041183900)
Phogat, Usha (60872296800)
Mukherjee, Shaibal (58302491700)
Issue Date: 2026
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Kumar, M., Kumar Hindoliya, L., Paul, A., Yadav, S., Phogat, U., & Mukherjee, S. (2026). MemScope: Real-Time, Portable, Power- and Cost-Efficient Memristor Characterization System. IEEE Transactions on Instrumentation and Measurement, 75. https://doi.org/10.1109/TIM.2026.3726208
Abstract: Memristive devices have attracted significant attention due to their nonvolatile nature, scalability, and broad applicability in in-memory computing, neuromorphic computing, sensing, and hardware security. However, electrical characterization and real-time monitoring of memristors rely on bulky and expensive laboratory instruments, limiting portability and in situ experimentation. This has motivated the development of compact measurement platforms capable of extracting key memristor parameters with reliable accuracy and repeatability. This article presents MemScope, a compact, visualization-driven current–voltage (I – V) immunity for accurate I – V characterization platform designed for low-cost, portable, and field-deployable measurement of memristive devices. It integrates synchronized dual digital-to-analog converters (DACs) and a 16-bit analog-to-digital converter (ADC) to enable bidirectional voltage sweeps, real-time current acquisition, and compliance protection. An interactive graphical user interface (GUI) provides immediate visualization of switching dynamics, hysteresis behavior, and parameter variations, while automated SD-card logging supports offline analysis. Measurement performance is validated through direct correlation with a Keithley 4200A-SCS semiconductor parameter analyzer, showing current deviations within approximately 5 % over most of the voltage sweep. These results demonstrate that MemScope offers an effective, accurate, and accessible solution for interactive instrumentation and experimental memristor research. © 1963-2012 IEEE.
URI: https://dx.doi.org/10.1109/TIM.2026.3726208
https://dspace.iiti.ac.in/handle/123456789/19401
ISSN: 0018-9456
Type of Material: Journal Article
Appears in Collections:Centre for Advanced Electronics (CAE)
Department of Electrical Engineering

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetric Badge: