Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5160
Title: Outage probability of ultra high frequency and millimeter wave based hetnets with NOMA
Authors: Swami, Pragya
Bhatia, Vimal
Keywords: Base stations;Heterogeneous networks;Intelligent systems;Millimeter waves;Monte Carlo methods;Partial discharges;Probability;Stochastic systems;Analytical results;Millimeter-wave communication;Multiple access;Numerical results;Outage performance;Outage probability;Stochastic geometry;Ultra-high frequency;Outages
Issue Date: 2019
Publisher: VDE Verlag GmbH
Citation: Swami, P., Mishra, M. K., Bhatia, V., & Ratnarajah, T. (2019). Outage probability of ultra high frequency and millimeter wave based hetnets with NOMA. Paper presented at the Proceedings of the International Symposium on Wireless Communication Systems, , 2019-August 166-170. doi:10.1109/ISWCS.2019.8877297
Abstract: This paper studies the outage performance of heterogeneous network consisting of ultra high frequency base stations (UHBSs) and millimeter wave base stations (MWBSs). Offloading to MWBS is performed based on the average received power from the base stations of the two tiers, i.e., UHBS and MWBS tier. Both the UHBS and MWBS employ non-orthogonal multiple access (NOMA) to support the users. Furthermore, the impact of the channel gain difference (CGD) between the users paired at the MWBS tier is investigated in detail. The numerical results show that offloading to MWBS achieves significant improvement in the outage probability of the offloaded user. In addition, offloading to MWBS tier also improves the outage performance at the UHBS tier. Besides, it is observed that the CGD between the paired users at the MWBS tier plays a vital role in the outage performance of the offloaded user. The analytical results are verified using Monte Carlo simulations. © 2019 IEEE.
URI: https://doi.org/10.1109/ISWCS.2019.8877297
https://dspace.iiti.ac.in/handle/123456789/5160
ISBN: 9781728125275
ISSN: 2154-0217
Type of Material: Conference Paper
Appears in Collections:Department of Electrical Engineering

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