Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5202
Title: Mutation-based bee colony optimization algorithm for near-ML detection in GSM-MIMO
Authors: Datta, Arijit
Bhatia, Vimal
Keywords: 5G mobile communication systems;Bit error rate;Channel state information;Communication channels (information theory);Computational complexity;Maximum likelihood;Mean square error;Modulation;Optimization;Signal detection;Signal receivers;Artificial bee colonies;Artificial bee colony optimizations;Bit error rate (BER) performance;Imperfect channel state information;MIMO detection;Minimum mean square error detection (MMSE);Mutation;Spatial modulations;MIMO systems
Issue Date: 2019
Publisher: Springer Verlag
Citation: Datta, A., Mandloi, M., & Bhatia, V. (2019). Mutation-based bee colony optimization algorithm for near-ML detection in GSM-MIMO doi:10.1007/978-981-13-2553-3_13
Abstract: Generalized spatial modulation multiple-input multiple-output (GSM-MIMO) is a promising technique to fulfil the ever-growing need for high data rates and high spectral efficiency for 5G and beyond systems. Maximum likelihood (ML) detection achieves optimal performance for GSM-MIMO systems. However, ML detection performs an exhaustive search and hence, ML have intractable exponential computational complexity. Hence, low complexity detection algorithms are needed to be explored for reliable detection in GSM-MIMO systems. In this paper, a novel and robust GSM-MIMO detection algorithm are proposed based on artificial bee colony optimization with mutation operator. Simulation results validate that the proposed algorithm outperforms minimum mean square error detection and achieves near-ML bit error rate performance for GSM-MIMO systems, under both perfect and imperfect channel state information at the receiver. © Springer Nature Singapore Pte Ltd. 2019.
URI: https://doi.org/10.1007/978-981-13-2553-3_13
https://dspace.iiti.ac.in/handle/123456789/5202
ISBN: 9789811325526
ISSN: 1876-1100
Type of Material: Conference Paper
Appears in Collections:Department of Electrical Engineering

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