Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5257
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dc.contributor.authorChatterjee, Amiten_US
dc.contributor.authorDhanotia, Jitendraen_US
dc.contributor.authorBhatia, Vimalen_US
dc.contributor.authorDisawal, Reenaen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-17T15:39:09Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-17T15:39:09Z-
dc.date.issued2018-
dc.identifier.citationChatterjee, A., Dhanotia, J., Bhatia, V., Disawal, R., & Prakash, S. (2018). Simultaneous measurement of thickness and refractive index using wedge plate lateral shearing interferometry and fourier transform method. Paper presented at the 2017 6th International Conference on Computer Applications in Electrical Engineering - Recent Advances, CERA 2017, , 2018-January 381-384. doi:10.1109/CERA.2017.8343359en_US
dc.identifier.isbn9781509048748-
dc.identifier.otherEID(2-s2.0-85050927197)-
dc.identifier.urihttps://doi.org/10.1109/CERA.2017.8343359-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/5257-
dc.description.abstractWe propose a technique for simultaneous measurement of thickness and refractive index (RI) using wedge plate lateral shearing interferometry combined with Fourier fringe analysis. Collimated light beam transmitted through transparent glass plate (GP) is analyzed by a wedge plate and spatial filtering arrangement. Wedge plate displaces incident wavefront by a small amount. Fringe pattern is obtained by interference of original and displaced wavefronts. To extract the information of thickness and RI simultaneously, the specimen is rotated and the phase variation of interferograms before and after rotation are determined using Fourier fringe analysis technique. © 2017 IEEE.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.source2017 6th International Conference on Computer Applications in Electrical Engineering - Recent Advances, CERA 2017en_US
dc.subjectFourier transformsen_US
dc.subjectInterferometryen_US
dc.subjectShearingen_US
dc.subjectThickness measurementen_US
dc.subjectWavefrontsen_US
dc.subjectFourier fringe analysisen_US
dc.subjectFourier fringe analysis techniqueen_US
dc.subjectFourier transform methoden_US
dc.subjectLateral shearing interferometryen_US
dc.subjectSimultaneous measurementen_US
dc.subjectSpatial filteringsen_US
dc.subjectThicknessen_US
dc.subjectTransparent glass platesen_US
dc.subjectRefractive indexen_US
dc.titleSimultaneous measurement of thickness and refractive index using wedge plate lateral shearing interferometry and fourier transform methoden_US
dc.typeConference Paperen_US
Appears in Collections:Department of Electrical Engineering

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