Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5272
Title: Design of 3D cylindrical GAA-TFET based on germanium source with drain underlap for low power applications
Authors: Shah, Ambika Prasad
Vishvakarma, Santosh Kumar
Keywords: Drain current;Electric fields;Electric resistance;Electron devices;Electron tunneling;Energy gap;Germanium;Ions;Tunnel field effect transistors;Band to band tunneling;DC characteristics;Device performance;Gate-all-around;Low power application;Off-state leakage current;Series resistances;Ultralow power application;Solid state devices
Issue Date: 2017
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Beohar, A., Shah, A. P., Yadav, N., & Vishvakarma, S. K. (2017). Design of 3D cylindrical GAA-TFET based on germanium source with drain underlap for low power applications. Paper presented at the EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits, , 2017-January 1-2. doi:10.1109/EDSSC.2017.8126563
Abstract: This paper presents a Cylindrical GAA TFET based on germanium source for low power applications. The proposed device used the merits of low band gap material such as germanium, which is used as a material in the source region. Device investigations have been made in terms of DC characteristics like ION, IOFF, SS, ION/IOFF. The proposed device increases ONcurrent as high as 1.9×10-5A/μm, which corresponds to 7×improvement in ION/IOFF ratio when compared with the Si-GAATFET. Whereas, drain underlap causes increase in series resistance across drain-channel junction, which reduces the electric field by increasing the tunneling barrier width at the drain side, significantly reduced off-state leakage current. This shows the better device performance to address the requirement of ultra-low power applications. © 2017 IEEE. All rights reserved.
URI: https://doi.org/10.1109/EDSSC.2017.8126563
https://dspace.iiti.ac.in/handle/123456789/5272
ISBN: 9781538629079
Type of Material: Conference Paper
Appears in Collections:Department of Electrical Engineering

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