Please use this identifier to cite or link to this item:
https://dspace.iiti.ac.in/handle/123456789/5305
Title: | Pore based indexing for High-Resolution Fingerprints |
Authors: | Anand, Vijay Kanhangad, Vivek |
Keywords: | Biometrics;Coding errors;Network security;Delau-nay triangulations;Fingerprint images;Fingerprint indexing;Fingerprint scanners;High resolution;Indexing algorithms;Level-1;Performance measure;Indexing (of information) |
Issue Date: | 2017 |
Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Citation: | Anand, V., & Kanhangad, V. (2017). Pore based indexing for high-resolution fingerprints. Paper presented at the 2017 IEEE International Conference on Identity, Security and Behavior Analysis, ISBA 2017, doi:10.1109/ISBA.2017.7947685 |
Abstract: | Most of the existing fingerprint indexing algorithms are based on either macro-level (level-1) details such as singularities or level-2 details such as minutiae in the fingerprint image. Level-3 features such as pores have not been explored much for fingerprint indexing as it requires fingerprint scanners with resolution greater than 1000 dpi. However, pores in fingerprint images are known to contain a significant amount of discriminatory information. Therefore, there is a need to investigate the effectiveness of pore features for fingerprint indexing. This paper presents a fingerprint indexing algorithm based on pore features which are extracted by applying Delaunay triangulation on the detected pores. Experiments are performed on the publicly available High Resolution Fingerprint (HRF) database (DBII). Performance measures from our experiments show the effectiveness of the proposed indexing algorithm and indicate that pore features alone are viable for fingerprint indexing. © 2017 IEEE. |
URI: | https://doi.org/10.1109/ISBA.2017.7947685 https://dspace.iiti.ac.in/handle/123456789/5305 |
ISBN: | 9781509055920 |
Type of Material: | Conference Paper |
Appears in Collections: | Department of Electrical Engineering |
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Altmetric Badge: