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https://dspace.iiti.ac.in/handle/123456789/5397
Title: | Machine learning approach for epileptic seizure detection using wavelet analysis of EEG signals |
Authors: | Kumar, Abhishek |
Keywords: | Artificial intelligence;Diagnosis;Discrete wavelet transforms;Electroencephalography;Fractal dimension;Fractals;Frequency bands;Learning systems;Medical imaging;Radial basis function networks;Signal processing;Support vector machines;Wavelet analysis;Epileptic seizure detection;Gaussian radial basis functions;Machine learning approaches;seizure;Sensitivity and specificity;Support vector machine classifiers;Time frequency analysis;wavelet;Wavelet transforms |
Issue Date: | 2014 |
Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Citation: | Kumar, A., & Kolekar, M. H. (2014). Machine learning approach for epileptic seizure detection using wavelet analysis of EEG signals. Paper presented at the 2014 International Conference on Medical Imaging, m-Health and Emerging Communication Systems, MedCom 2014, 412-416. doi:10.1109/MedCom.2014.7006043 |
Abstract: | Analysis of EEG is the primary method for diagnosis of epilepsy. In this paper discrete wavelet transform is used for the time-frequency analysis of EEG signal. Using discrete wavelet transform, EEG signal is decomposed into five different frequency bands namely delta, theta, alpha, beta and gamma. Only theta, alpha and beta carry seizure information. Statistical feature like energy, variance and zero crossing rate and nonlinear feature like fractal dimension is extracted from each of the three sub bands and fed to support vector machine classifier. Support vector machine classifies the input EEG signal into seizure free and seizure signal. Experimental results show that the proposed method classifies EEG signals with excellent accuracy, sensitivity and specificity compared to the existing methods. © 2014 IEEE. |
URI: | https://doi.org/10.1109/MedCom.2014.7006043 https://dspace.iiti.ac.in/handle/123456789/5397 |
ISBN: | 9781479950973 |
Type of Material: | Conference Paper |
Appears in Collections: | Department of Electrical Engineering |
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