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Title: | Optical switch with ultra high extinction ratio using electrically controlled metal diffusion |
Authors: | Singh, Lalit Srivastava, Sulabh Rajput, Swati Kaushik, Vishal Mishra, Rahul Dev Kumar, Mukesh |
Keywords: | Electric fields;Metal ions;Metals;Nanophotonics;Optical switches;Switching;Waveguides;Controlled diffusion;Coupled waveguide systems;Electrical control;Integrated photonic circuit;Nanophotonic waveguides;Optical extinction;Resistive switching;Thin dielectric layer;Light extinction |
Issue Date: | 2021 |
Publisher: | The Optical Society |
Citation: | Singh, L., Srivastava, S., Rajput, S., Kaushik, V., Mishra, R. D., & Kumar, M. (2021). Optical switch with ultra high extinction ratio using electrically controlled metal diffusion. Optics Letters, 46(11), 2626-2629. doi:10.1364/OL.428710 |
Abstract: | An optical switch with ultra high extinction ratio is proposed. Optical switching is realized using the resistive switching effect through the lateral coupling between the input nanophotonic waveguide and output waveguide at a wavelength of 1550 nm. The coupled waveguide system is engineered to increase the number of mode beats in a unit length of the device. An increase in the number of mode beats and controlled diffusion of metal ions through a thin dielectric layer with an applied electric field is responsible for a high optical extinction ratio of 27 dB for a 20 µm long device. Compared to electrical control by plasma dispersion in silicon, the resistive switching effect enables a reduction in the coupling length and an increase in the waveguide absorption, leading to an almost 100 times higher extinction ratio. The proposed compact on-chip silicon-based nanophotonic resistive device is a potential candidate for a large-scale integrated photonic circuit for applications in optical switching, modulation, memory, and computation. © 2021 Optical Society of America |
URI: | https://doi.org/10.1364/OL.428710 https://dspace.iiti.ac.in/handle/123456789/5499 |
ISSN: | 0146-9592 |
Type of Material: | Journal Article |
Appears in Collections: | Department of Electrical Engineering |
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