Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5508
Title: D flip-flop based TRNG with zero hardware cost for IoT security applications
Authors: Khan, Sajid
Shah, Ambika Prasad
Vishvakarma, Santosh Kumar
Keywords: Budget control;Cryptography;Data privacy;Hardware security;Internet of things;Number theory;Random number generation;System-on-chip;Advanced Encryption Standard;FPGA implementations;Internet of thing (IOT);Post layout simulation;Proposed architectures;Random number generators;Secure transmission;Security application;Flip flop circuits
Issue Date: 2021
Publisher: Elsevier Ltd
Citation: Khan, S., Shah, A. P., Chouhan, S. S., Pandey, J. G., & Vishvakarma, S. K. (2021). D flip-flop based TRNG with zero hardware cost for IoT security applications. Microelectronics Reliability, 120 doi:10.1016/j.microrel.2021.114098
Abstract: System-on-chips (SoCs) for the Internet of things (IoT) applications require hardware-based integrated random number generators for the secure transmission of information. However, they have limited hardware and power budget, which limits the use of on-chip dedicated True Random Number Generator (TRNG). In this work, a symmetric D flip-flop with integrated TRNG is proposed. The proposed architecture is implemented using a standard 40 nm CMOS technology. The post-layout simulation results show that it offers good randomness with low energy-per-bit. In addition, the circuit has passed all the tests of NIST without any post-processing. When compared with the conventional D flip-flop, it has almost negligible area overhead that is only 0.14%. An FPGA implementation is also presented as a proof of concept that confirms the simulation results. Advanced Encryption Standard (AES) key expansion algorithm is also implemented to demonstrate the dual usage of the proposed D flip-flop. © 2021 Elsevier Ltd
URI: https://doi.org/10.1016/j.microrel.2021.114098
https://dspace.iiti.ac.in/handle/123456789/5508
ISSN: 0026-2714
Type of Material: Journal Article
Appears in Collections:Department of Electrical Engineering

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