Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5596
Title: Low Complexity Least Minimum Symbol Error Rate Based Post-Distortion for Vehicular VLC
Authors: Bhatia, Vimal
Keywords: Budget control;Errors;Light;Vehicle to vehicle communications;Convergence characteristics;Fourier features;Low-dimensional approximation;Minimum symbol error rates;Nonlinear transfer;Post-distortion;Reproducing Kernel Hilbert spaces;Visible light communications (VLC);Visible light communication
Issue Date: 2020
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Mitra, R., Miramirkhani, F., Bhatia, V., & Uysal, M. (2020). Low complexity least minimum symbol error rate based post-distortion for vehicular VLC. IEEE Transactions on Vehicular Technology, 69(10), 11800-11810. doi:10.1109/TVT.2020.3018740
Abstract: Vehicular visible light communications (VLC) has emerged as a viable supplement for high speed next-generation vehicle to vehicle (V2V) communication systems. However, performance of a V2V-VLC link is impaired due to nonlinear transfer-characteristics of light emitting diodes (LEDs), and inter-symbol interference (ISI). In this article, a low-complexity least-squares based post-distortion algorithm is formulated over reproducing kernel Hilbert space (RKHS) for a multi-hop V2V-VLC link. The impairments encountered in V2V-VLC channels are mitigated in RKHS by a minimum symbol error-rate post-distorter using a low dimensional approximation of random Fourier features (RFF) (which is a soft approximation of the feature-map to RKHS), that facilitates computationally simple post-distortion under finite memory-budget. The convergence and the BER-performance of the proposed post-distorter is analyzed over realistic V2V VLC channels obtained via ray-tracing. From the analysis, and the presented computer-simulations, the proposed post-distorter is found to exhibit equivalent convergence characteristics and error-rate over reasonable distances, with much lower computational complexity. © 1967-2012 IEEE.
URI: https://doi.org/10.1109/TVT.2020.3018740
https://dspace.iiti.ac.in/handle/123456789/5596
ISSN: 0018-9545
Type of Material: Journal Article
Appears in Collections:Department of Electrical Engineering

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