Process Variation and NBTI Resilient Schmitt Trigger for Stable and Reliable Circuits

Abstract

Negative bias temperature instability (NBTI) is a major time-dependent reliability concern with the pMOS transistor at elevated temperature. NBTI in pMOS is the severe dominating factor of circuit reliability as it increases the threshold voltage with time. In this paper, an nMOS-only Schmitt trigger with a voltage booster (NST-VB) circuit is proposed. The use of only an nMOS transistor in the critical path of the Schmitt trigger circuit drastically reduces the effect of NBTI on the circuit and, hence, improves performance. The proposed circuit is less affected by both inter-die and intra-die process variations in consequence of an nMOS-only structure. Because of NBTI, the increase in delay for the proposed NST-VB circuit is only 0.47% compared to 7.2% and 1.47% for the conventional Schmitt trigger and nMOS inverter, respectively, after the stress time of three years. The proposed NST-VB circuit is also validated with an s27 benchmark circuit from the ISCAS'89 benchmark set and found that it has a lower effect of NBTI compared to CMOS and Schmitt trigger inverter circuits. For the viability of the proposed circuit, figure-of-merit (FOM) is used as a performance metric and it is found that the proposed circuit has {15.11\times } improved FOM compared to the conventional Schmitt trigger circuit. © 2001-2011 IEEE.