Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/6099
Title: Theoretical simulation of Hybrid II-O/III-N green light-emitting diode with MgZnO/InGaN/MgZnO heterojunction
Authors: Verma, Shruti
Mukherjee, Shaibal
Keywords: Augers;Design;Efficiency;Electroluminescence;Heterojunctions;Hole concentration;Light;Quantum efficiency;Zinc oxide;Auger recombination;Efficiency droops;InGaN;Internal quantum efficiency;ZnO;Light emitting diodes
Issue Date: 2015
Publisher: Elsevier Ltd
Citation: Verma, S., Pandey, S. K., Pandey, S. K., & Mukherjee, S. (2015). Theoretical simulation of hybrid II-O/III-N green light-emitting diode with MgZnO/InGaN/MgZnO heterojunction. Materials Science in Semiconductor Processing, 31, 340-350. doi:10.1016/j.mssp.2014.12.016
Abstract: We propose a hybrid light-emitting diode (LED) design comprising of p-MgZnO/InGaN/n-MgZnO sandwiched structure and emanating green electroluminescence centered at 560 nm. Different design strategies for optimizing the internal quantum efficiency (IQE) through 2-D numerical simulation have been proposed. Moreover, the feasibility of device realization is also reviewed. Detailed study of the effects of alloy composition, dopant concentration, and thickness of the electron blocking layer (EBL) and hole blocking layer (HBL) on the IQE is carried out. The optimization in selecting materials for EBL, HBL, and active layer is addressed while maximizing device IQE and reducing the efficiency droop. The impact of Auger non-radiative recombination on luminous power and quantum efficiency is discussed. The mechanisms behind efficiency droop, namely Auger recombination and electron leakage are elaborated. It is found that the hybrid LED shows the highest IQE of 93% with minimum efficiency droop as compared to ZnO based and GaN based LEDs for similar design parameters. ©2014 Elsevier Ltd. All rights reserved.
URI: https://doi.org/10.1016/j.mssp.2014.12.016
https://dspace.iiti.ac.in/handle/123456789/6099
ISSN: 1369-8001
Type of Material: Journal Article
Appears in Collections:Department of Electrical Engineering

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