Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/6863
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dc.contributor.authorPadwal, Parth S.en_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-21T10:51:33Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-21T10:51:33Z-
dc.date.issued2013-
dc.identifier.citationDongre, G. G., Padwal, P. S., Singh, R. K., & Joshi, S. S. (2013). Effect of silver coating on silicon ingot slicing by wire-EDM process. Paper presented at the Transactions of the North American Manufacturing Research Institution of SME, , 41 75-84.en_US
dc.identifier.isbn9781627486972-
dc.identifier.issn1047-3025-
dc.identifier.otherEID(2-s2.0-84892733865)-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/6863-
dc.description.abstractThe wire-EDM process for silicon ingot slicing is helpful in minimizing wafer thickness and kerf loss. However, the cutting rate of the process must be improved to make it as a potential alternative to abrasive wire saw process. This paper describes the effect of silver coating on silicon in increasing the cutting rate by reducing the contact resistance between the electrodes. It also addresses the effect of silver coating on kerf width and surface roughness which are important for silicon ingot slicing process. While the silver coating of silicon improves cutting rate by 40%, thermal modeling of the cutting process corroborates the improvement in the cutting rate.en_US
dc.language.isoenen_US
dc.sourceTransactions of the North American Manufacturing Research Institution of SMEen_US
dc.subjectCutting rateen_US
dc.subjectKerf widthen_US
dc.subjectSilicon ingoten_US
dc.subjectSilver coatingsen_US
dc.subjectWire-EDMen_US
dc.subjectCoatingsen_US
dc.subjectIndustrial researchen_US
dc.subjectIngotsen_US
dc.subjectManufactureen_US
dc.subjectSiliconen_US
dc.subjectSilicon wafersen_US
dc.subjectSilveren_US
dc.subjectSurface roughnessen_US
dc.subjectCermetsen_US
dc.titleEffect of silver coating on silicon ingot slicing by wire-EDM processen_US
dc.typeConference Paperen_US
Appears in Collections:Department of Mechanical Engineering

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