Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/6947
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dc.contributor.authorSharma, Vishalen_US
dc.contributor.authorGupta, Shantanuen_US
dc.contributor.authorMehta, Gauraven_US
dc.contributor.authorLad, Bhupesh Kumaren_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-21T10:51:50Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-21T10:51:50Z-
dc.date.issued2021-
dc.identifier.citationSharma, V., Gupta, S., Mehta, G., & Lad, B. K. (2021). A quantum-based diagnostics approach for additive manufacturing machine. IET Collaborative Intelligent Manufacturing, 3(2), 184-192. doi:10.1049/cim2.12022en_US
dc.identifier.issn2516-8398-
dc.identifier.otherEID(2-s2.0-85107534522)-
dc.identifier.urihttps://doi.org/10.1049/cim2.12022-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/6947-
dc.description.abstractCurrent Additive Manufacturing machines have limited techniques to observe process conditions and to decrease process errors. In order to overcome these limitations and increase the level and accuracy of machine intelligence, machine conditions need to be monitored more meticulously. A novel method for the condition monitoring of a 3D-printer is proposed in this paper. Quantum support vector machine (QSVM) is compiled for recognizing the health condition of the 3D-printer. The proposed quantum machine learning approach helps in monitoring the health state of the machine and classifies the same as healthy or aberrant. Classical machine learning approaches are inefficient to process the large amount of experimental data in real time. For better decision-making on such big data, quantum machine learning approaches are deployed which are much more efficient due to their exponential speed and parallel operation on complex sensor data, they show speedups in both the dimensionality and number of experimental data deployed to train the algorithm. The simulation results show that the proposed method has higher accuracy in fault diagnosis than the traditional Support Vector Machine. All the numerical simulations and experiments have been carried out on a real quantum hardware provided by the IBM Quantum computing over the cloud. © 2021 The Authors. IET Collaborative Intelligent Manufacturing published by John Wiley & Sons Ltd on behalf of The Institution of Engineering and Technologyen_US
dc.language.isoenen_US
dc.publisherJohn Wiley and Sons Incen_US
dc.sourceIET Collaborative Intelligent Manufacturingen_US
dc.subject3D printersen_US
dc.subjectAdditivesen_US
dc.subjectCondition monitoringen_US
dc.subjectDecision makingen_US
dc.subjectPrinting pressesen_US
dc.subjectQuantum computersen_US
dc.subjectQuantum theoryen_US
dc.subjectSupport vector machinesen_US
dc.subjectHealth conditionen_US
dc.subjectMachine intelligenceen_US
dc.subjectMachine learning approachesen_US
dc.subjectParallel operationsen_US
dc.subjectProcess conditionen_US
dc.subjectProcess errorsen_US
dc.subjectQuantum Computingen_US
dc.subjectQuantum machinesen_US
dc.subjectLearning systemsen_US
dc.titleA quantum-based diagnostics approach for additive manufacturing machineen_US
dc.typeJournal Articleen_US
dc.rights.licenseAll Open Access, Gold-
Appears in Collections:Department of Mechanical Engineering

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