Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/7089
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dc.contributor.authorPalani, Anand Iyamperumalen_US
dc.date.accessioned2022-03-17T01:00:00Z-
dc.date.accessioned2022-03-21T10:52:26Z-
dc.date.available2022-03-17T01:00:00Z-
dc.date.available2022-03-21T10:52:26Z-
dc.date.issued2019-
dc.identifier.citationPaneerselvam, E., Kikuchi, T., Ikenoue, H., Vasa, N. J., Palani, I. A., Higashihata, M., . . . Ramachandra Rao, M. S. (2019). Selective area laser-assisted doping of SiC thin films and blue light electroluminescence. Journal of Physics D: Applied Physics, 52(48) doi:10.1088/1361-6463/ab3e97en_US
dc.identifier.issn0022-3727-
dc.identifier.otherEID(2-s2.0-85073156310)-
dc.identifier.urihttps://doi.org/10.1088/1361-6463/ab3e97-
dc.identifier.urihttps://dspace.iiti.ac.in/handle/123456789/7089-
dc.description.abstractLaser-assisted doping combined with annealing technique is used in selective areas to form a p-n junction on a SiC thin film grown by the pulsed laser deposition on a Si substrate at a temperature of 800 °C. This approach in an aluminum chloride solution and a phosphoric solution has resulted in p-SiC/n-Si and n-SiC/p-Si hetero-structures, respectively. Further, a functional in-plane p-n junction is realized side-by-side on the post-deposited SiC thin film. I-V characteristics by two probe technique showed the p-n diode characteristics. Blue light (400 nm) electroluminescence from the p-n junction on SiC thin film was observed in the forward biased condition. Further, an improvement in the I-V reverse characteristics was observed by illuminating the p-n SiC thin film with green/blue light. © 2019 IOP Publishing Ltd.en_US
dc.language.isoenen_US
dc.publisherInstitute of Physics Publishingen_US
dc.sourceJournal of Physics D: Applied Physicsen_US
dc.subjectAluminum chlorideen_US
dc.subjectChlorine compoundsen_US
dc.subjectElectroluminescenceen_US
dc.subjectLighten_US
dc.subjectPulsed laser depositionen_US
dc.subjectPulsed lasersen_US
dc.subjectSemiconductor dopingen_US
dc.subjectSemiconductor junctionsen_US
dc.subjectSilicon carbideen_US
dc.subjectAnnealing techniquesen_US
dc.subjectIV characteristicsen_US
dc.subjectLaser-assisteden_US
dc.subjectProbe techniqueen_US
dc.subjectReverse characteristicsen_US
dc.subjectSelective areasen_US
dc.subjectSiC thin filmsen_US
dc.subjectSide by sidesen_US
dc.subjectThin filmsen_US
dc.titleSelective area laser-assisted doping of SiC thin films and blue light electroluminescenceen_US
dc.typeJournal Articleen_US
Appears in Collections:Department of Mechanical Engineering

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