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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Palani, Anand Iyamperumal | en_US |
dc.date.accessioned | 2022-03-17T01:00:00Z | - |
dc.date.accessioned | 2022-03-21T10:52:26Z | - |
dc.date.available | 2022-03-17T01:00:00Z | - |
dc.date.available | 2022-03-21T10:52:26Z | - |
dc.date.issued | 2019 | - |
dc.identifier.citation | Paneerselvam, E., Kikuchi, T., Ikenoue, H., Vasa, N. J., Palani, I. A., Higashihata, M., . . . Ramachandra Rao, M. S. (2019). Selective area laser-assisted doping of SiC thin films and blue light electroluminescence. Journal of Physics D: Applied Physics, 52(48) doi:10.1088/1361-6463/ab3e97 | en_US |
dc.identifier.issn | 0022-3727 | - |
dc.identifier.other | EID(2-s2.0-85073156310) | - |
dc.identifier.uri | https://doi.org/10.1088/1361-6463/ab3e97 | - |
dc.identifier.uri | https://dspace.iiti.ac.in/handle/123456789/7089 | - |
dc.description.abstract | Laser-assisted doping combined with annealing technique is used in selective areas to form a p-n junction on a SiC thin film grown by the pulsed laser deposition on a Si substrate at a temperature of 800 °C. This approach in an aluminum chloride solution and a phosphoric solution has resulted in p-SiC/n-Si and n-SiC/p-Si hetero-structures, respectively. Further, a functional in-plane p-n junction is realized side-by-side on the post-deposited SiC thin film. I-V characteristics by two probe technique showed the p-n diode characteristics. Blue light (400 nm) electroluminescence from the p-n junction on SiC thin film was observed in the forward biased condition. Further, an improvement in the I-V reverse characteristics was observed by illuminating the p-n SiC thin film with green/blue light. © 2019 IOP Publishing Ltd. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Institute of Physics Publishing | en_US |
dc.source | Journal of Physics D: Applied Physics | en_US |
dc.subject | Aluminum chloride | en_US |
dc.subject | Chlorine compounds | en_US |
dc.subject | Electroluminescence | en_US |
dc.subject | Light | en_US |
dc.subject | Pulsed laser deposition | en_US |
dc.subject | Pulsed lasers | en_US |
dc.subject | Semiconductor doping | en_US |
dc.subject | Semiconductor junctions | en_US |
dc.subject | Silicon carbide | en_US |
dc.subject | Annealing techniques | en_US |
dc.subject | IV characteristics | en_US |
dc.subject | Laser-assisted | en_US |
dc.subject | Probe technique | en_US |
dc.subject | Reverse characteristics | en_US |
dc.subject | Selective areas | en_US |
dc.subject | SiC thin films | en_US |
dc.subject | Side by sides | en_US |
dc.subject | Thin films | en_US |
dc.title | Selective area laser-assisted doping of SiC thin films and blue light electroluminescence | en_US |
dc.type | Journal Article | en_US |
Appears in Collections: | Department of Mechanical Engineering |
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