Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/7639
Title: ALD Grown ZnO on Polymeric Template
Authors: Mathur, Aakash
Pal, Dipayan
Chattopadhyay, Sudeshna
Keywords: Atomic layer deposition;Crystalline materials;Deposition;Film growth;Interfaces (materials);Metallic films;Metals;Optical films;Photoluminescence;Polymers;Polystyrenes;Reflection;X ray diffraction;X ray scattering;Zinc compounds;Zinc oxide;Crystalline structure;Deep level emission;Hybrid structure;Near band edge emissions;Polymeric templates;Polystyrene films;Sharp interface;X ray reflectivity;Thin films
Issue Date: 2017
Publisher: Wiley-VCH Verlag
Citation: Mathur, A., Pal, D., & Chattopadhyay, S. (2017). ALD grown ZnO on polymeric template. Macromolecular Symposia, 376(1) doi:10.1002/masy.201600210
Abstract: ZnO thin film was grown on polystyrene template using atomic layer deposition (ALD) technique. The synthesized thin film was characterized using X-ray reflectivity, X-ray diffraction, and photoluminescence. X-ray reflectivity confirms the growth of ZnO thin film with bulklike electron density, on top of polystyrene film without causing any perturbation in the underneath polymeric template. The X-ray diffraction result reveals the crystalline structure of the ALD grown ZnO. Photoluminescence (PL) study of ZnO thin film on polymeric template shows the presence of strong characteristic near band edge emission (NBE) in the UV range along with a defect related deep level emission (DLE) in the visible region. The results confirm the growth of good quality crystalline ZnO thin film on polymeric template maintaining a sharp interface in metal-oxide/polymer hybrid structure. © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
URI: https://doi.org/10.1002/masy.201600210
https://dspace.iiti.ac.in/handle/123456789/7639
ISSN: 1022-1360
Type of Material: Journal Article
Appears in Collections:Department of Metallurgical Engineering and Materials Sciences

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