Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/8250
Title: Zn1−xSixO: Reduced photosensitivity, improved stability and enhanced conductivity
Authors: Sen, Somaditya
Keywords: Carrier concentration;Convergence of numerical methods;Display devices;Electric conductivity;II-VI semiconductors;Light;Sol-gel process;Sol-gels;Surface defects;Transparent electrodes;Appropriate materials;Deep level trap;Electronic device;Enhanced conductivity;Photo-stability;Sensitivity;Surface conductivity;UV and visible light;Image enhancement
Issue Date: 2018
Publisher: Acta Materialia Inc
Citation: Srivastava, T., Bajpai, G., Liu, S. W., Biring, S., & Sen, S. (2018). Zn1−xSixO: Reduced photosensitivity, improved stability and enhanced conductivity. Scripta Materialia, 150, 42-44. doi:10.1016/j.scriptamat.2018.02.038
Abstract: Effect of different wavelengths (350, 380, 390, 400, 450, 550 & 650 nm) of light on surface conductivity of sol-gel synthesized Zn1−xSixO material has been observed. Enhancement in conductivity at all wavelengths of light had been attributed to enhanced charge carrier concentration with silicon doping. Reduction in sensitivity for UV and visible light wavelength indicates reduction of surface defects and deep level traps with Si4+ incorporation. Enhanced photo stability with Si4+ doping makes it an appropriate material for transparent electrodes used in various display and electronic devices. © 2018 Elsevier Ltd
URI: https://doi.org/10.1016/j.scriptamat.2018.02.038
https://dspace.iiti.ac.in/handle/123456789/8250
ISSN: 1359-6462
Type of Material: Journal Article
Appears in Collections:Department of Physics

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