Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/11964
Title: Outage probability of multiple-IRS-assisted SISO wireless communications over Rician fading
Authors: Bhatia, Vimal
Keywords: Coding gain;Diversity order;Intelligent reflecting surface;Outage probability;Rician fading channel;Single-input–single-output
Issue Date: 2023
Publisher: Elsevier B.V.
Citation: Hindustani, R. K., Dixit, D., Sharma, S., & Bhatia, V. (2023). Outage probability of multiple-IRS-assisted SISO wireless communications over rician fading. Physical Communication, 59 doi:10.1016/j.phycom.2023.102102
Abstract: Outage probability (OP) performance of multiple-intelligent reflecting surface (IRS)-assisted is presented for a practically important single-input-single-output (SISO) wireless communication system over Rician fading channels where the IRS panel selection is considered. We investigate the SISO wireless communication scenario in which a single antenna transmitting node is sending its message to the receiving node with the aid of the best IRS panel selection. This wireless communication scenario model is a typical application of the uplink scenarios for future cellular wireless systems. We derive approximate OP expressions in the closed form using both the central limit theorem and the Laguerre series expansion. Further, we also derive a simple asymptotic OP to get diversity order and coding gain. The influence of each system parameter on OP performance is thoroughly investigated. In addition, the analytical OP results are corroborated with simulated OP results to confirm the accuracy of our presented analytical results. © 2023 Elsevier B.V.
URI: https://doi.org/10.1016/j.phycom.2023.102102
https://dspace.iiti.ac.in/handle/123456789/11964
ISSN: 1874-4907
Type of Material: Journal Article
Appears in Collections:Department of Electrical Engineering

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