Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/15742
Title: A Parallel Plate Waveguide Measurement Technique for Characterizing Frequency Selective Surfaces
Authors: Sainadh, Patinavalasa Megh
James, Sneha Kanjickal
Ghosh, Saptarshi
Keywords: bandpass;bandstop;Frequency selective surface (FSS);parallel plate waveguide;thru-reflect-line
Issue Date: 2024
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Sainadh, P. M., James, S. K., & Ghosh, S. (2024). A Parallel Plate Waveguide Measurement Technique for Characterizing Frequency Selective Surfaces. ISAP 2024 - International Symposium on Antennas and Propagation. https://doi.org/10.1109/ISAP62502.2024.10846496
Abstract: This paper presents a parallel plate waveguide (PPW) system to characterize frequency selective surfaces (FSSs) in microwave frequencies. The setup includes two metallic sheets placed parallel to each other with a feeding source at each end that provides a wideband impedance matching. The dimensions of the sheet have been varied gradually to minimize the edge radiation effect, whereas the thru-reflect-line (TRL) calibration technique has been carried out for accurate measurement. Three different FSS geometries, one bandstop, one bandpass, and one broadband absorber have been considered, and their scattering parameters have been determined. The responses have been compared with those of the unit cell simulated responses, and good agreement are observed in all cases, thereby validating the effectiveness and accuracy of the proposed PPW system. © 2024 IEEE.
URI: https://doi.org/10.1109/ISAP62502.2024.10846496
https://dspace.iiti.ac.in/handle/123456789/15742
Type of Material: Conference Paper
Appears in Collections:Department of Electrical Engineering

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