Digital Processing Core Performance Degradation Due to Hardware Stress Attacks

Abstract

Nanoscale designs suffer from a major bottleneck of device aging that is characterized by its failure mechanism. Device aging may be caused by persistent device delay degradation that finally results in failure. Furthermore, some major factors that affect delay degradation are threshold voltage, temperature, and inputvector patterns. This phenomenon of accelerated aging through delay degradation can be easily exploited by a cyberat tacker who has knowledge of it. © 1988-2012 IEEE.