Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5221
Title: Comparative Analysis of Single and Multistep Interferogram Processing Techniques
Authors: Chatterjee, Amit
Dhanotia, Jitendra
Bhatia, Vimal
Keywords: Fourier transforms;Image processing;Optical data processing;Fourier transform method;Interferogram analysis;Interferogram processing;Non-sinusoidal waveforms;Optical interferograms;Phase extraction;Phase-shifting;Scientific researches;Interferometry
Issue Date: 2018
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Chatterjee, A., Dhanotia, J., Bhatia, V., Rana, S., & Prakash, S. (2018). Comparative analysis of single and multistep interferogram processing techniques. Paper presented at the 2017 14th IEEE India Council International Conference, INDICON 2017, doi:10.1109/INDICON.2017.8487516
Abstract: Digital processing of optical interferograms have been used for wide range of applications in engineering and scientific research. Some of the applications include measurement of step height, tilt angle, micro-displacement, deformation, etc. Two main interferogram processing techniques are phase shifting (PS) and Fourier Transform method (FTM). PS technique has been used to demodulate the phase information from multiple phase shifted interferograms; whereas FT is used to extract phase information from a single interferogram. In this paper, we perform a comparative analysis of PS and FTM technique using simulation analysis. The techniques are assessed based on two common problems, i.e. noise and non-sinusoidal waveforms (harmonics) that arise in the measurement system and reduce the accuracy. A new multi-step imaging technique is proposed by combining the advantages of PS and FTM and is also compared based on the same parameters. Advantages and drawbacks of each technique are also discussed. © 2017 IEEE.
URI: https://doi.org/10.1109/INDICON.2017.8487516
https://dspace.iiti.ac.in/handle/123456789/5221
ISBN: 9781538643181
Type of Material: Conference Paper
Appears in Collections:Department of Electrical Engineering

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