Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5940
Title: Automated detection of focal EEG signals using features extracted from flexible analytic wavelet transform
Authors: Gupta, Vipin
Priya, Tanvi
Yadav, Abhishek Kumar
Pachori, Ram Bilas
Keywords: Automation;Diagnosis;Electroencephalography;Entropy;Nearest neighbor search;Neurology;Patient treatment;Risk perception;Signal detection;Support vector machines;Wavelet transforms;41A05;41A10;65D05;65D17;FAWT;Biomedical signal processing
Issue Date: 2017
Publisher: Elsevier B.V.
Citation: Gupta, V., Priya, T., Yadav, A. K., Pachori, R. B., & Rajendra Acharya, U. (2017). Automated detection of focal EEG signals using features extracted from flexible analytic wavelet transform. Pattern Recognition Letters, 94, 180-188. doi:10.1016/j.patrec.2017.03.017
Abstract: Epilepsy is a neurological disease which is difficult to diagnose accurately. An authentic detection of focal epilepsy will help the clinicians to provide proper treatment for the patients. Generally, focal electroencephalogram (EEG) signals are used to diagnose the epilepsy. In this paper, we have developed an automated system for the detection of focal EEG signals using differencing and flexible analytic wavelet transform (FAWT) methods. The differenced EEG signals are subjected to 15 levels of FAWT. Various entropies namely cross correntropy, Stein's unbiased risk estimate (SURE) entropy, and log energy entropy are extracted from the reconstructed original signal and 16 sub-band signals. The statistically significant features are obtained from Kruskal–Wallis test based on (p < 0.05). K-nearest neighbor (KNN) and least squares support vector machine (LS-SVM) classifiers with different distances and kernels respectively are used for automated diagnosis. In the proposed methodology, we have achieved classification accuracy of 94.41% in detecting focal EEG signals using LS-SVM classifier with ten-fold cross validation strategy. © 2017 Elsevier B.V.
URI: https://doi.org/10.1016/j.patrec.2017.03.017
https://dspace.iiti.ac.in/handle/123456789/5940
ISSN: 0167-8655
Type of Material: Journal Article
Appears in Collections:Department of Electrical Engineering

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