Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/5946
Title: Improved accuracy in slope measurement and defect detection using Fourier fringe analysis
Authors: Dhanotia, Jitendra
Disawal, Reena
Bhatia, Vimal
Keywords: Charge coupled devices;Defects;Fourier transforms;Interferometry;Measurements;Accuracy and precision;Defect detection;Detection of defects;Direct phase measurement;Fourier fringe analysis;Fourier transform method;Phase detection;Slope measurement;Phase measurement
Issue Date: 2017
Publisher: Elsevier GmbH
Citation: Dhanotia, J., Disawal, R., Bhatia, V., & Prakash, S. (2017). Improved accuracy in slope measurement and defect detection using fourier fringe analysis. Optik, 140, 921-930. doi:10.1016/j.ijleo.2017.05.023
Abstract: This communication reports investigation undertaken towards measurement of slope and defect detection of bent plates (rectangular and circular) using moiré deflectometry in conjunction with Fourier transform technique. For slope mapping, specimen is illuminated by collimated light from a laser. The back reflected light from the front surface of the specimen is incident on a set of two gratings placed in tandem, resulting in the formation of laterally sheared interferograms. The interferograms are recorded using a CCD (charge coupled device) camera. Direct phase measurement using Fourier transform method has been used for measurement of slope and detection of defects. The experimental setup is simple and the slope measurement and detection of defects are undertaken successfully in each case. Experimental results conclusively establish the viability of the technique. Good accuracy and precision in measurement have been achieved. © 2017 Elsevier GmbH
URI: https://doi.org/10.1016/j.ijleo.2017.05.023
https://dspace.iiti.ac.in/handle/123456789/5946
ISSN: 0030-4026
Type of Material: Journal Article
Appears in Collections:Department of Electrical Engineering

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