Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/7591
Title: Explicit Model of Channel Charge, Backscattering, and Mobility for Graphene FET in Quasi-Ballistic Regime
Authors: Kushwaha, Ajay Kumar
Vishvakarma, Santosh Kumar
Keywords: Backscattering;Ballistics;Carrier mobility;Charge density;Drain current;Electric fields;Electromagnetic wave scattering;Field effect transistors;Graphene;Mathematical models;Scattering;Backscattering coefficients;Drift diffusion;Fermi velocities;Integrated circuit modeling;Quasi-ballistic;Two-dimensional displays;Graphene transistors
Issue Date: 2018
Publisher: Institute of Electrical and Electronics Engineers Inc.
Citation: Upadhyay, A. K., Kushwaha, A. K., Rastogi, P., Chauhan, Y. S., & Vishvakarma, S. K. (2018). Explicit model of channel charge, backscattering, and mobility for graphene FET in quasi-ballistic regime. IEEE Transactions on Electron Devices, 65(12), 5468-5474. doi:10.1109/TED.2018.2877631
Abstract: Ballistic (collision free) and drift-diffusive (collision dominated) transport mechanisms are both present in graphene, and they together contribute in the current conduction in a graphene FET (GFET). In this paper, we propose an analytical drain current model based on ballistic (nB) and drift-diffusive (nD) charge densities, backscattering coefficient (R), and quasi-ballisticmobility (μeff).nB is calculated using the McKelvey flux theory and nD using the surface potential approach. A closed-form analytical expression is derived for the backscattering coefficient, which is valid under both low and high electric field conditions. The effective quasi-ballistic mobility is obtained by considering both scattering-dominated and scattering free mobilities. The proposed model is well aligned with experimental data, in all regions of operation, for single- and double-gate GFETs. © 2018 IEEE.
URI: https://doi.org/10.1109/TED.2018.2877631
https://dspace.iiti.ac.in/handle/123456789/7591
ISSN: 0018-9383
Type of Material: Journal Article
Appears in Collections:Department of Metallurgical Engineering and Materials Sciences

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetric Badge: