Please use this identifier to cite or link to this item: https://dspace.iiti.ac.in/handle/123456789/7755
Title: Electronic properties of Fe2TiSn1-xSix
Authors: Chaudhuri, Sayan
Bhobe, Preeti Anand
Issue Date: 2017
Publisher: American Institute of Physics Inc.
Citation: Chaudhuri, S., Bhobe, P. A., & Nigam, A. K. (2017). Electronic properties of Fe2TiSn1-xSix. Paper presented at the AIP Conference Proceedings, , 1832 doi:10.1063/1.4980651
Abstract: Transport properties of Heusler compositions, Fe2TiSn1-xSix (x = 0, 0.05, 0.1) have been investigated with temperature dependent electrical resistivity measurements in the presence of magnetic field. The parent composition, Fe2TiSn, is prone to Fe/Ti antisite disorder that gets reflected in its low temperature resistivity behavior. With Si doping, this disorder is seen to decrease. However, solubility limit of Si is reached with x = 0.1. X-ray diffraction profile shows clear signatures of secondary phase formation in x = 0.1, disturbing the L21 symmetry in x = 0 and 0.05. It is noticed that samples show a superconducting drop at ∼ 4K. This is not a bulk property though, and comes to fore due to presence of excess Sn on the sample surface. © 2017 Author(s).
URI: https://doi.org/10.1063/1.4980651
https://dspace.iiti.ac.in/handle/123456789/7755
ISBN: 9.78074E+12
ISSN: 0094-243X
Type of Material: Conference Paper
Appears in Collections:Department of Physics

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